P-scan Stack System - Automated Ultrasonic Inspection

Phased array probe and sample wedge specifications1080-2pix-gradient

The P-scan Stack Phased array probes are specially designed and manufactured to meet the high standards of the P-Scan Stack System. And, because the P-Scan Stack System imports the probe parameters directly from the probe during set-up, you don’t have to download parameters from the probe manufacturer in order to maintain internal probe libraries. 

Sample specifications for 1D linear phased array probes


Technical specifications

Probe IdentityFrequencyArray typeNo. of elementsPitchExternal length
5A16-0.6-165 MHzAzimuthal160.6 mm16 mm
5A32-0.6-265 MHzAzimuthal320.6 mm26 mm
0.5L32-2.3-870.5 MHzLinear322.3 mm87 mm
5L64-0.6-455 MHzLinear640.6 mm45 mm

Sample wedge specifications


Technical specifications

Wedge IdentityFor Array TypeFits Probe IDNominal Angel in SteelWave Type
A16-55LWAzimuthal5A16-0.6-1655°Longitudinal
A16-55SWAzimuthal5A16-0.6-1655°Shear
A26-55LWAzimuthal5A32-0.6-1655°Longitudinal
A26-55SWAzimuthal5A32-0.6-1655°Shear
L87-0LWLinear0.5L32-2.3-87Longitudinal
L87-55LWLinear0.5L32-2.3-8755°Longitudinal
L45-0LWLinear5L64-0.6-45Longitudinal
L45-55LWLinear5L64-0.6-4555°Longitudinal
L45-55SWLinear5L64-0.6-4555°Shear

Specifications are subject to change without notice.

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Do you have any questions or would you like to know more about the P-scan Stack System? Please fill in the form and we’ll get back to you as soon as possible.  

Phone: +45 4325 0000